Data for "Coincidence technique to study ioninduced electron emission from atomically thin materials"

Contents of this data set

This repository contains the processed experimental data as well as the evaluation procedure applied to create the figures published in "Coincidence technique to study ion-induced electron emission from atomically thin materials". 

Context and methodology

• The ion beam spectrometer (for highly charged ions) at TU Wien can be used to perform complex coincidence spectroscopy. This data set is used to show the possible options based on example measurements.
• The data comprises coincidence measurement results in a list-mode fashion, i.e. for single impinging ions we record the impact position (x/y) on our 2D position-sensitive particle detector and the time of flight of the projectiles from sample to detector. Depending on the used detector, we additionally have information on the number of created secondary electrons (yield) or the electron energy.

Technical details

• The dataset includes two analysis files in .dgraph-format (see below). The first file "_FIGs24" is the basis for Figures 2 and 4 and uses the electron yield detection for the coincidence spectroscopy. The second file ("_FIG3") uses the electron energy detector. All manuscript figures (excluding schematics) can be reproduced using these data files. The data inside the files is structured in a folder-tree labelled according to the content of the figure.
• DataGraph from Visual Data Tools is required to open this data set. The data was created using version 5.5.2beta.