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        <datestamp>2026-05-04T08:44:53Z</datestamp>
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                  <creatorName nameType="Personal">Singh, Balram</creatorName>
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                  <familyName>Singh</familyName>
                  <affiliation affiliationIdentifier="https://ror.org/04d836q62" affiliationIdentifierScheme="ROR">TU Wien</affiliation>
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                <creator>
                  <creatorName nameType="Personal">Fernandez-Pacheco, Amalio</creatorName>
                  <givenName>Amalio</givenName>
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                <creator>
                  <creatorName nameType="Personal">Singh, Aman</creatorName>
                  <givenName>Aman</givenName>
                  <familyName>Singh</familyName>
                  <affiliation affiliationIdentifier="https://ror.org/04zb59n70" affiliationIdentifierScheme="ROR">Leibniz Institute for Solid State and Materials Research</affiliation>
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                  <creatorName nameType="Personal">Neu, Volker</creatorName>
                  <givenName>Volker</givenName>
                  <familyName>Neu</familyName>
                  <affiliation affiliationIdentifier="https://ror.org/04zb59n70" affiliationIdentifierScheme="ROR">Leibniz Institute for Solid State and Materials Research</affiliation>
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                  <creatorName nameType="Personal">Jurczyk, Jakub</creatorName>
                  <givenName>Jakub</givenName>
                  <familyName>Jurczyk</familyName>
                  <affiliation affiliationIdentifier="https://ror.org/04d836q62" affiliationIdentifierScheme="ROR">TU Wien</affiliation>
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                <creator>
                  <creatorName nameType="Personal">Mikulik, Stefan</creatorName>
                  <givenName>Stefan</givenName>
                  <familyName>Mikulik</familyName>
                  <affiliation affiliationIdentifier="https://ror.org/04d836q62" affiliationIdentifierScheme="ROR">TU Wien</affiliation>
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              <titles>
                <title>Geometric dependence of exchange bias in tilted three-dimensional CoFe/IrMn microwires</title>
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              <publisher>TU Wien</publisher>
              <publicationYear>2026</publicationYear>
              <subjects>
                <subject subjectScheme="FOS">Engineering and technology</subject>
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              <contributors>
                <contributor contributorType="Other">
                  <contributorName nameType="Personal">Krien, Cornelia</contributorName>
                  <givenName>Cornelia</givenName>
                  <familyName>Krien</familyName>
                  <affiliation>Leibniz IFW Dresden</affiliation>
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              <dates>
                <date dateType="Issued">2026-04-24</date>
                <date dateType="Accepted" dateInformation="npj Spintronics">2026-04-18</date>
                <date dateType="Updated">2026-05-04</date>
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              <language>eng</language>
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              <relatedIdentifiers>
                <relatedIdentifier relatedIdentifierType="URL" relationType="IsOriginalFormOf" resourceTypeGeneral="Text">https://arxiv.org/abs/2601.09653</relatedIdentifier>
                <relatedIdentifier relatedIdentifierType="DOI" relationType="IsVersionOf">10.48436/1mmyr-rtv31</relatedIdentifier>
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                <description descriptionType="Abstract">Geometric dependence of exchange bias in tilted three-dimensional CoFe/IrMn microwires

The following description provides structured information to help users understand, interpret, and reuse this dataset:

Context and methodology



This dataset belongs to the field of experimental condensed matter physics and focuses on exchange bias in three-dimensional nanomagnetic systems. It is associated with the study of tilted CoFe/IrMn microwires and their comparison with planar thin films.

The dataset was created to investigate how geometric tilting influences exchange bias and coercivity. The data were obtained using magneto-optical Kerr effect (MOKE) measurements performed on fabricated three-dimensional microwire structures and planar reference samples.

The measurements include magnetic hysteresis loops recorded at different tilt angles and material configurations. Post-processing was performed to extract the coercive field (Hc), exchange bias (Heb), and interface roughness parameters.


Technical details

The dataset is organized according to the figures presented in the main manuscript and supplementary information. File names follow a consistent naming convention indicating the figure number, sample geometry (tilted wire or planar film), tilt angle, and material composition.

The dataset contains:



Hysteresis loop data (.txt) with magnetic field and normalized magnetization values

Extracted parameters (.txt) containing coercive field (Hc), exchange bias (Heb), and corresponding errors

Power spectral density data (.dat) used for roughness analysis

Processed datasets (.csv) used for plotting relationships such as coupling constant versus roughness


All files are provided in standard formats (TXT, DAT, CSV) and can be opened using Python, MATLAB, Origin, or Microsoft Excel. No proprietary software is required.

A README file is included in the dataset to provide detailed information about file structure, data format, column definitions, and guidelines for reuse.

Further details





The dataset supports the results presented in the associated publication and enables reproducibility of the figures and analysis. Detailed experimental procedures, fabrication methods, and interpretation of results are described in the corresponding manuscript.




The data can be reused under the specified Creative Commons license with appropriate citation of the dataset and the related publication.</description>
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