2026-08-13T19:55:12Z https://researchdata.tuwien.ac.at/oai2d

oai:researchdata.tuwien.ac.at:2fq1g-36t75 2026-07-29T12:02:09Z community-app openaire_data

4.5 TUW.TUDATA oai:researchdata.tuwien.ac.at:2fq1g-36t75 Spannagl, Sebastian Sebastian Spannagl TU Wien Jurczyk, Jakub Jakub Jurczyk TU Wien Niggas, Anna Anna Niggas TU Wien TU Wien 2026 highly charged ions nanostructuring 2Dmaterials Wilhelm, Richard Arthur Richard Arthur Wilhelm 0000-0001-9451-5440 TU Wien Schleberger, Marika Marika Schleberger University of Duisburg-Essen Breuer, Lars Lars Breuer University of Duisburg-Essen Frank, Carolin Carolin Frank University of Duisburg-Essen Uppsala University Seyller, Thomas Thomas Seyller Chemnitz University of Technology Turchanin, Andrey Andrey Turchanin Friedrich Schiller University Jena Andelkovic, Zoran Zoran Andelkovic GSI Helmholtz Centre for Heavy Ion Research Stallkamp, Nils S. Nils S. Stallkamp GSI Helmholtz Centre for Heavy Ion Research Herfurth, Frank Frank Herfurth GSI Helmholtz Centre for Heavy Ion Research 2026-07-28 2025-03-07/2025-03-14 2026-07-29 10.48436/2fq1g-36t75 10.48436/pqbew-2hs73 https://researchdata.tuwien.ac.at/communities/app/ Creative Commons Attribution 4.0 International Contents of this data set This repository contains the microscopy data taken in the course of the Bachelor thesis "Microscopy Analysis of Samples Irradiated using 6keV/u slow Au79+ ions at GSI's HITRAP facility". The work in the course of this thesis was performed by S. Spannagl, supervised by Dr. A. Niggas and Prof. R.A. Wilhelm. Context and methodology Slow highly charged ion irradiation was perfored at GSI Darmstadt: Au79+ ions at an energy of 6keV/u were supplied by the HITRAP facility and nine samples were irradiated under high vacuum conditions:  ionic crystal: CaF2 quasi-freestanding single-, bi- and trilayer graphene (prepared by the Chemnitz University of Technology, group of T. Seyller) TMDCs: MoS2 on SiO2, MoS2 on Au, WS2 on SiO2 (several samples prepared by FSU Jena and University Duisburg-Essen; groups of A. Tuchanin and M. Schleberger)  Samples were transferred and imaged at ambient pressures to TU Wien for microscopy analysis including: scanning electron microscopy (SEM) for the graphene-based samples atomic force microscopy (AFM) for all samples  confocal microsope (CaF2) CaF2 samples were imaged prior and after etching with HNO3.  Technical details The dataset comprises several files: a folder "Thesis_Figures" including all used microscopy data acquired at TU Wien (each folder is named according to the imaged sample number and microscopy technique)  a folder "All_Data" including all microscopy data aquired at TU Wien (the original folder tree as saved on the AFM PC is stored, e.g. each folder contains the date of the microscopy session and the file names include the sample number) "figure_list.txt" indicates which of the measurements was used for the corresponding figure in the thesis "BA_Spannagl.pdf" is the final version of the Bachelor thesis. Figures are saved in the following formats: AFM images are saved as ".ibw"-files, which can be opened and processed using the free software Gwyddion. screenshots showing the positioning of the AFM cantilever on the sample surface are saved as ".tif" files SEM images are available as ".tif" files