# bulk EMC v(E), intrinsic phonon stack (no substrate terms)
# bulk EMC v(E) of the device cross-check channel stack (HfO2, N_it=1e12 cm^-2,
# screening at 1e13 cm^-2); mean and standard error over 4 seeds, 40000 steps of 1e-16 s each
# E[V/m]  v[m/s]  SE[m/s]  mu=v/E[cm^2/Vs]
2.0000e+04 3.9950e+02 1.2179e+02 1.9975e+02
5.0000e+04 1.0941e+03 1.1816e+02 2.1881e+02
1.0000e+05 2.1954e+03 9.7264e+01 2.1954e+02
2.0000e+05 4.3983e+03 8.3038e+01 2.1992e+02
5.0000e+05 1.0900e+04 9.6101e+01 2.1799e+02
1.0000e+06 2.0850e+04 7.7378e+01 2.0850e+02
2.0000e+06 3.7830e+04 1.1713e+02 1.8915e+02
3.0000e+06 5.1228e+04 1.7351e+02 1.7076e+02
5.0000e+06 7.6202e+04 1.7433e+02 1.5240e+02
1.0000e+07 1.4517e+05 6.3909e+02 1.4517e+02
