# bulk EMC v(E), intrinsic phonon stack (no substrate terms)
# bulk EMC v(E) of the device cross-check channel stack (HfO2, N_it=1e12 cm^-2,
# screening at 1e13 cm^-2); mean and standard error over 4 seeds, 40000 steps of 1e-16 s each
# E[V/m]  v[m/s]  SE[m/s]  mu=v/E[cm^2/Vs]
2.0000e+04 4.1940e+02 7.4044e+01 2.0970e+02
5.0000e+04 9.7591e+02 6.0194e+01 1.9518e+02
1.0000e+05 1.8869e+03 5.1668e+01 1.8869e+02
2.0000e+05 3.8669e+03 6.3174e+01 1.9335e+02
5.0000e+05 9.3572e+03 5.1604e+01 1.8714e+02
1.0000e+06 1.7922e+04 1.4318e+01 1.7922e+02
2.0000e+06 3.2030e+04 3.0430e+01 1.6015e+02
3.0000e+06 4.3109e+04 5.3954e+01 1.4370e+02
5.0000e+06 5.9477e+04 7.1593e+01 1.1895e+02
1.0000e+07 8.6042e+04 1.0561e+02 8.6042e+01
