# bulk EMC v(E) of the device cross-check channel stack (HfO2, N_it=1e12 cm^-2,
# screening at 1e13 cm^-2); mean and standard error over 4 seeds, 40000 steps of 1e-16 s each
# E[V/m]  v[m/s]  SE[m/s]  mu=v/E[cm^2/Vs]
2.0000e+04 4.6496e+02 1.0016e+02 2.3248e+02
5.0000e+04 9.5204e+02 5.9440e+01 1.9041e+02
1.0000e+05 1.8422e+03 6.1222e+01 1.8422e+02
2.0000e+05 3.7036e+03 1.0167e+02 1.8518e+02
5.0000e+05 9.1299e+03 1.3041e+02 1.8260e+02
1.0000e+06 1.7959e+04 9.3851e+01 1.7959e+02
2.0000e+06 3.4460e+04 9.4433e+01 1.7230e+02
3.0000e+06 4.8936e+04 1.1118e+02 1.6312e+02
5.0000e+06 7.5516e+04 2.0404e+02 1.5103e+02
1.0000e+07 1.4656e+05 1.0880e+03 1.4656e+02
