# bulk EMC v(E), intrinsic phonon stack (no substrate terms)
# bulk EMC v(E) of the device cross-check channel stack (HfO2, N_it=1e12 cm^-2,
# screening at 1e13 cm^-2); mean and standard error over 4 seeds, 40000 steps of 1e-16 s each
# E[V/m]  v[m/s]  SE[m/s]  mu=v/E[cm^2/Vs]
2.0000e+04 4.8328e+02 7.4073e+01 2.4164e+02
5.0000e+04 1.1168e+03 5.0494e+01 2.2335e+02
1.0000e+05 2.1408e+03 1.0112e+02 2.1408e+02
2.0000e+05 4.2530e+03 7.2168e+01 2.1265e+02
5.0000e+05 1.0472e+04 8.6332e+01 2.0945e+02
1.0000e+06 1.8479e+04 4.0013e+01 1.8479e+02
2.0000e+06 2.6848e+04 5.7334e+01 1.3424e+02
3.0000e+06 2.9853e+04 4.6819e+01 9.9509e+01
5.0000e+06 3.2004e+04 1.5353e+01 6.4008e+01
1.0000e+07 3.5534e+04 1.1549e+01 3.5534e+01
