# bulk EMC v(E) of the device cross-check channel stack (HfO2, N_it=1e12 cm^-2,
# screening at 1e13 cm^-2); mean and standard error over 4 seeds, 40000 steps of 1e-16 s each
# E[V/m]  v[m/s]  SE[m/s]  mu=v/E[cm^2/Vs]
2.0000e+04 3.0818e+02 2.1143e+01 1.5409e+02
5.0000e+04 7.6805e+02 3.5249e+01 1.5361e+02
1.0000e+05 1.5912e+03 3.7440e+01 1.5912e+02
2.0000e+05 2.9771e+03 5.6945e+01 1.4885e+02
5.0000e+05 7.6807e+03 4.1906e+01 1.5361e+02
1.0000e+06 1.4988e+04 3.6771e+01 1.4988e+02
2.0000e+06 2.7963e+04 1.1013e+02 1.3982e+02
3.0000e+06 3.8938e+04 7.5482e+01 1.2979e+02
5.0000e+06 5.6095e+04 3.2970e+01 1.1219e+02
1.0000e+07 8.5021e+04 9.7778e+01 8.5021e+01
