# bulk EMC v(E) of the device cross-check channel stack (HfO2, N_it=1e12 cm^-2,
# screening at 1e13 cm^-2); mean and standard error over 4 seeds, 40000 steps of 1e-16 s each
# E[V/m]  v[m/s]  SE[m/s]  mu=v/E[cm^2/Vs]
2.0000e+04 4.1809e+02 9.6872e+01 2.0904e+02
5.0000e+04 7.8686e+02 9.7560e+01 1.5737e+02
1.0000e+05 1.6333e+03 5.4122e+01 1.6333e+02
2.0000e+05 3.4661e+03 5.5856e+01 1.7330e+02
5.0000e+05 8.2481e+03 1.8904e+01 1.6496e+02
1.0000e+06 1.5387e+04 7.2384e+01 1.5387e+02
2.0000e+06 2.4280e+04 4.4077e+01 1.2140e+02
3.0000e+06 2.8227e+04 4.7139e+01 9.4091e+01
5.0000e+06 3.1233e+04 2.9311e+01 6.2467e+01
1.0000e+07 3.5125e+04 4.2260e+01 3.5125e+01
